[Gate-users] NEC curves/dead-time

[Sebastien JAN]

Hi,

> I would be in particular interrested in knowing how to model different % 
> dead-time losses for trues, scatters and randoms with GATE.

I'm not sure to understand very well what you mean, but the "global" 
dead time due to the detection/electronic/coincidence processing/data 
transfert....can not discriminate if an event is true, scatter or random.
Basically, if you want to model a realistic dead-time chain, you need to 
define the following modules with GATE :

1/ dead time applied on the single detection (to model the DT due to the 
scintillation + electronic frontend)

2/ DT module on the coincidence sorter (including the delayed coincidences)

3/ pile-up module for data transfert (from scanner to data storage)

For details, see the last version of the users guide.

Hope this help

Cheers
Sebastien