[Gate-users] NEC curves/dead-time

[Bastien Guerin]

Dear all,

I am trying to simulate NEC curves with GATE but cannot achieve good agreement with measurements. The reason for that seems to be that % losses of trues, scatters and randoms coincidences due to dead-time are not the same in measurements, whereas the standard techniques of dead-time simulation with para and non-para models give exactly the same % dead-time for trues, scatters and randoms (easy to prove).

I have seen number of GATE papers addressing the challenge of modeling PET scanners at high count rates, so does anyone could share his/her expertise on how to model realistic count rates at high activity? I would be in particular interrested in knowing how to model different % dead-time losses for trues, scatters and randoms with GATE.

Many thanks,

Bastien G.
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Bastien P Guerin
PhD candidate, University of Paris VI
Visiting Fellow, Harvard University
t: 617 817 2762
f: 617 732 6695
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